The neutron reflectometer MARIA with polarization analysis has been designed for the investigation of thin magnetic layered structures down to the monolayer scale and lateral structures. The reflection of polarised neutrons allows to determine individually the density and the modulus and the direction of the magnetisation vector of buried layers.
MARIA is optimised for layer thicknesses between
Beside the above described reflectometer mode with good resolution in the horizontal scattering plane, MARIA can be used in the GISANS mode with additional resolution in the vertical direction. The latter mode allows one to measure lateral structures down to the nm scale.
All parts of MARIA are controlled by a computer system according to the “Jülich-Munich” standard based on a Linux workstation. This allows a flexible remote control with automatic scan programs, including the control of sample environment as cryostat and electromagnet.
The optimal sample size for MARIA is
Besides the described cryogenic temperatures and magnetic fields MARIA can provide a fully equipped Oxid-MBE (Molecular Beam Epitaxy) to the user. The typical sample sizes are
With scattering under grazing incidence we investigate depth-resolved the laterally-averaged magnetizations and the correlations between their lateral fluctuations. With an additionally polarized neutron beam we derive a vector information on the laterally-averaged magnetization (reflectivity) and on the correlations between their lateral fluctuations (off-specular scattering – µm length scale, GISANS – nm length scale).
In general MARIA can be used for measurements of magnetic roughness, the formation of magnetic domains in thin layered structures, lateral structures, etc. (polarized mode) and density profiles, structures of solid polymer layers, etc. (unpolarized mode with higher intensity).
Furthermore possible without the need for multilayers investigation of:
At the sample position a Hexapod with an additional turntable (360°) is installed, which can take a load up to
Flux at sample
Distances and angles
Dr. Stefan Mattauch
Dr. Alexandros Koutsioumpas
Dr. Sabine Pütter